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| Quantity | Price |
|---|---|
| 1+ | Rs.4,216.710 |
| 10+ | Rs.4,040.930 |
| 25+ | Rs.3,879.690 |
Product Information
Product Overview
The MP-P100 U1 is a precision spring-loaded test probe featuring a fine 0.35mm plunger with a 50° tip configuration. Designed for accurate contact on small test pads and fine features, it is suitable for PCB in-circuit testing (ICT), functional verification, and production test fixtures requiring controlled force and repeatable engagement. With its fine 0.35mm 50° tip and robust gold-plated construction, the MP-P100 U1 test probe is well suited for high-precision test environments where accuracy, durability, and consistent electrical performance are essential.
- Plunger: Full-hard Beryllium Copper, gold-plated over nickel for excellent electrical performance and long mechanical life
- Barrel: Gold-plated brass providing corrosion resistance and durability
- Spring: Stainless steel for stable and consistent contact force
- Receptacle: Gold-plated brass for secure, low-resistance connections
- Recommended minimum centre spacing: 2.54mm (100mil)
- Full travel: 6.30mm
- Spring pressure (+20% tolerance): 150g / 250g
- Current rating: 3A continuous
- Contact resistance: ≤ 50mΩ
- Mounting hole size: Ø1.75mm
Applications
Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development
Technical Specifications
Plunger
Multicomp Pro Test Probe Tips
Test Probes
No SVHC (25-Jun-2025)
Technical Docs (1)
Legislation and Environmental
Country in which last significant manufacturing process was carried outCountry of Origin:China
Country in which last significant manufacturing process was carried out
RoHS
Product Compliance Certificate