MP-P50 G1
Test Accessory, 0.5mm OD, Plunger, Test Probes, Multicomp Pro Test Probe Tips
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| Quantity | Price |
|---|---|
| 1+ | Rs.6,593.280 |
| 10+ | Rs.6,319.300 |
| 25+ | Rs.6,067.140 |
Product Information
Product Overview
The MP-P50 G1 is a compact, high-precision spring-loaded test probe designed for reliable electrical contact in PCB testing, in-circuit testing (ICT), and functional test applications. Featuring a slim 0.5mm outer diameter plunger, it is well suited for high-density board layouts while maintaining consistent mechanical and electrical performance. Gold-plated contact surfaces and premium spring materials ensure low contact resistance, stable conductivity, and long service life in both development and high-volume production environments.
- Slim 0.5mm OD plunger for dense PCB designs
- Gold-plated contacts for enhanced conductivity and corrosion resistance
- Consistent 80g spring force for stable electrical connection
- 3A continuous current rating
- Suitable for automated and fixture-based test systems
- Plunger: Full-hard Beryllium Copper, gold-plated over nickel
- Barrel: Brass, gold-plated
- Spring: Stainless steel
- Receptacle: Brass, gold-plated
Applications
Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development
Technical Specifications
Plunger
Multicomp Pro Test Probe Tips
Test Probes
No SVHC (25-Jun-2025)
Technical Docs (1)
Legislation and Environmental
Country in which last significant manufacturing process was carried outCountry of Origin:China
Country in which last significant manufacturing process was carried out
RoHS
Product Compliance Certificate